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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12465315 B1

PDFFull Text
Date of Patent:
Nov. 11, 2025

Filed:

Nov. 11, 2022

X-ray diagnosis apparatus and x-ray condition setting method

Applicant:

Canon Medical Systems Corporation, Otawara, JP;

Inventors:

Yusuke Kanno, Nasushiobara, JP;

Yoshiyasu Hayashi, Nasushiobara, JP;

Akio Tetsuka, Shioya, JP;

Tomukazu Ono, Otawara, JP;

Assignee:

CANON MEDICAL SYSTEMS CORPORATION, Otawara, JP;

Attorney:

Oblon, McClelland, Maier & Neustadt, L.L.P.

Primary Examiner:

Hugh Maupin

Int. Cl.
CPC ...
A61B 6/50 (2024.01); A61B 6/00 (2006.01); A61B 6/04 (2006.01); A61B 6/12 (2006.01); G06T 7/70 (2017.01);
U.S. Cl.
CPC ...
A61B 6/545 (2013.01); A61B 6/0407 (2013.01); A61B 6/12 (2013.01); A61B 6/541 (2013.01); G06T 7/70 (2017.01); G06T 2207/10116 (2013.01); G06T 2207/30021 (2013.01); G06T 2207/30052 (2013.01); G06T 2207/30096 (2013.01); G06T 2207/30101 (2013.01); G06T 2207/30204 (2013.01);
Abstract

An X-ray diagnosis apparatus according to an embodiment includes a processing circuitry. The processing circuitry is configured: to determine a region corresponding to a target object in an X-ray image, on the basis of the X-ray image; to calculate a statistical value related to the region, on the basis of a plurality of pixel values included in the region; and to set an X-ray condition related to generating X-rays, on the basis of the statistical value.

Find Patent Forward Citations

Kanno, Yusuke. (2025). X-ray diagnosis apparatus and x-ray condition setting method (U.S. Patent No. 12465315). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12465315

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