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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12465294 B1

PDFFull Text
Date of Patent:
Nov. 11, 2025

Filed:

Nov. 28, 2021

Local spectral-covariance or local spectral covariance deficits computation and display for highlighting of relevant material transitions in spectral ct and mr

Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Rafael Wiemker, Kisdorf, DE;

Liran Goshen, Pardes-Hanna, IL;

Hannes Nickisch, Hamburg, DE;

Claas Bontus, Hamburg, DE;

Tom Brosch, Hamburg, DE;

Jochen Peters, Norderstedt, DE;

Rolf Jürgen Weese, Norderstedt, DE;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:

Larry Liberchuk

Primary Examiner:

Keith M Raymond

Assistant Examiner:

Patrick M Mehl

Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 5/055 (2006.01); G06V 10/44 (2022.01); G06V 10/764 (2022.01);
U.S. Cl.
CPC ...
A61B 5/7425 (2013.01); A61B 5/055 (2013.01); G06V 10/44 (2022.01); G06V 10/764 (2022.01);
Abstract

The present invention relates to multispectral imaging. In order to improve an identification of relevant multispectral material transitions (in particular caused by injected contrast agent), an apparatus is proposed to use the local maxima of the variances and/or covariances of the intensities of the multi-channel images to locate material transitions. In comparison to gradient vectors, the local variance is not directed and not prone to noise. An alternative apparatus is proposed to use the local covariance deficits of the intensities of the multi-channel images to locate material transitions. The proposed alternative approach is independent of spatial drifts across the image volume.

Find Patent Forward Citations

Wiemker, Rafael. (2025). Local spectral-covariance or local spectral covariance deficits computation and display for highlighting of relevant material transitions in spectral ct and mr (U.S. Patent No. 12465294). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12465294

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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