The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2025

Filed:

Oct. 31, 2022
Applicant:

Alcon Inc., Fribourg, CH;

Inventor:

Utkarsh Sharma, Solon, OH (US);

Assignee:

Alcon Inc., Fribourg, CH;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); G01B 9/02 (2022.01);
U.S. Cl.
CPC ...
A61B 3/102 (2013.01); G01B 9/02 (2013.01);
Abstract

In certain embodiments, an OCT system sends a sample beam to a sample (e.g., an eye) along a sample path divided into multiple sample path ranges. The system sends a reference beam to a reference arm system with multiple reference arms, where each reference arm corresponds to a sample path range. Each arm has a specific dispersion level with a corresponding dispersion compensation parameter set designed to address the specific level. A detector detects reflected sample and reference beams. A computer performs the following for each sample path range: select the dispersion compensation parameter set corresponding to the reference arm of the sample path range; apply the dispersion compensation parameter set to the detector signal to yield image information; and process the image information. The computer generates an image of the sample from the image information for the sample path ranges.


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