The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2025

Filed:

May. 30, 2023
Applicant:

Huawei Technologies Co., Ltd., Shenzhen, CN;

Inventors:

Yanchun Wang, Shenzhen, CN;

Quan Zhou, Shanghai, CN;

Guojun Yue, Shanghai, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 36/08 (2009.01); H04W 36/00 (2009.01);
U.S. Cl.
CPC ...
H04W 36/08 (2013.01); H04W 36/0085 (2018.08); H04W 36/13 (2023.05);
Abstract

A cell measurement method and a related apparatus are provided. The method includes: a first access network device sends to a terminal device, through a first serving cell, first measurement control information indicating the terminal device to measure quality of a downlink reference signal of a virtual cell; receives a report regarding the quality; and migrates the terminal device to a third serving cell when the quality of the downlink reference signal of the virtual cell is higher than the one of the first serving cell. A center frequency of a downlink reference signal of the first serving cell is the same as the one of the virtual cell, a frequency range of the virtual cell is included in a frequency range of a second serving cell which overlaps with a frequency range of the first serving cell. Near-far interference to the terminal device is avoided.


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