The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2025

Filed:

Oct. 27, 2023
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Donggun Kim, Suwon-si, KR;

Soenghun Kim, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/10 (2009.01); H04W 76/19 (2018.01); H04W 76/27 (2018.01); H04W 76/30 (2018.01);
U.S. Cl.
CPC ...
H04W 24/10 (2013.01); H04W 76/19 (2018.02); H04W 76/27 (2018.02); H04W 76/30 (2018.02);
Abstract

A frequency measurement method performed by a user equipment (UE) in a wireless communication system is provided. The frequency measurement method includes: receiving a radio resource control (RRC) release message or system information including first frequency measurement configuration information for frequency measurement in an RRC inactive mode; performing frequency measurement in the RRC inactive mode based on the first frequency measurement configuration information; receiving first RRC resume message including an indicator requesting a measurement report in the RRC inactive mode; and transmitting an RRC resume complete message including the measurement report based on the indicator.


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