The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2025
Filed:
Jul. 25, 2022
Qualcomm Incorporated, San Diego, CA (US);
Jun Zhu, San Diego, CA (US);
Chinmay Shankar Vaze, San Diego, CA (US);
Mihir Vijay Laghate, San Diego, CA (US);
Raghu Narayan Challa, San Diego, CA (US);
Alexei Yurievitch Gorokhov, San Diego, CA (US);
Brian Clarke Banister, San Diego, CA (US);
Yongle Wu, San Diego, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
Methods, systems, and devices for wireless communications are described in which a user equipment (UE) may perform beam measurements for one or more subsets of beams that are selected to provide enhanced beam switch determinations. The UE may identify one or more prioritized beams, and may measure the prioritized beams at a same periodicity as measurements of a serving beam. The UE may, additionally or alternatively, identify a set of all layer one beams (e.g., maximum-level beams or top level beams) for measurement according to a periodic interval, based on a measured mobility being less than a threshold value. The periodic interval may provide that each layer one beam may be measured at a cadence of one beam per measurement occasion, in order to provide measurement diversity.