The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2025

Filed:

May. 09, 2022
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Jeffrey Matthew Kempf, Dallas, TX (US);

Alexander Lyubarsky, Dallas, TX (US);

Amit Mittal, Bangalore, IN;

Terry Alan Bartlett, Dallas, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 9/31 (2006.01); H04N 5/74 (2006.01);
U.S. Cl.
CPC ...
H04N 9/317 (2013.01); H04N 5/7458 (2013.01); H04N 9/3155 (2013.01);
Abstract

An apparatus includes a focusing lens, a SLM optically coupled to the focusing lens and comprising micromirrors on a surface of the SLM, where the focusing lens is tilted at an incident angle relative to the surface of the SLM, an incident light beam is illuminated on the SLM at the incident angle, and the incident angle is greater by an offset angle than twice a tilt angle of the micromirrors with respect to the surface of the SLM. The apparatus also includes an actuator optically coupled to the SLM, and projection optics optically coupled to the actuator.


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