The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2025
Filed:
Apr. 27, 2021
Ntt, Inc., Tokyo, JP;
Hiroki Kawahara, Musashino, JP;
Takeshi Seki, Musashino, JP;
NTT, Inc., Tokyo, JP;
Abstract
A multipath interference analysis device includes a statistical amount calculation unit that calculates statistical amounts of respective measurement values of splice loss measured from a plurality of optical fiber pieces for forming an optical transmission line, and measurement values of cutoff wavelength, a determination unit that determines a truncated normal distribution from a normal distribution of the cutoff wavelength, a random number generation unit that generates random numbers for selecting a predetermined number of pieces of splice connection targets of the optical transmission line, and an MPI value calculation unit that calculates an MPI value using a mode dependent loss of a fundamental mode of the optical transmission line formed of each piece selected according to the random numbers, and a splice interval.
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