The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2025

Filed:

Apr. 26, 2023
Applicant:

Huawei Technologies Co., Ltd., Guangdong, CN;

Inventors:

Zhiping Jiang, Kanata, CA;

Xiang Lin, Kanata, CA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/077 (2013.01); H04J 14/06 (2006.01);
U.S. Cl.
CPC ...
H04B 10/0775 (2013.01); H04J 14/06 (2013.01);
Abstract

A method for measuring polarization-dependent loss (PDL) of an optical link segment. The method has the steps of: measuring powers of first and second pilot tones (PTs) in a polarization-multiplexed (PM) optical signal at first and second link locations at or about an input and an output end of the optical link segment, respectively, the PM optical signal having first and second optical signals with orthogonal polarizations and amplitude-modulated by the first and second PTs, respectively; calculating a first orthogonal polarization power ratio (OPPR) of the first and second PTs using the powers thereof measured at the first link location; calculating a second OPPR of the first and second PTs using the powers thereof measured at the second link location; and calculating the PDL of the optical link segment based on a comparison between the first and second OPPRs.


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