The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2025

Filed:

Sep. 30, 2020
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Takashi Maruyama, Tokyo, JP;

Shigeo Udagawa, Tokyo, JP;

Mitsuru Kirita, Tokyo, JP;

Tai Tanaka, Tokyo, JP;

Ryotaro Ohashi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01Q 3/26 (2006.01); H01Q 3/36 (2006.01);
U.S. Cl.
CPC ...
H01Q 3/267 (2013.01); H01Q 3/36 (2013.01);
Abstract

A method for calibrating a phased array antenna is provided. The phased array antenna includes multiple transmission modules each including a phase shifter that changes a phase of a high frequency signal output from a signal source, an amplifier that amplifies an amplitude of the high frequency signal, and a transmission antenna that converts the high frequency signal into a radio wave, and a reception module including a reception antenna. The method includes a step of receiving, by the reception antenna, a reflected wave that is a radio wave transmitted from the transmission antenna of each of the multiple transmission modules and reflected outside the phased array antenna, and a step of adjusting the phase shifter and the amplifier of each of the multiple transmission modules based on an amplitude and a phase of the reflected wave received.


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