The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2025
Filed:
Oct. 10, 2023
Applicant:
Tohoku-microtec Co., Ltd., Sendai, JP;
Inventor:
Makoto Motoyoshi, Sendai, JP;
Assignee:
TOHOKU-MICROTEC CO., LTD., Sendai, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/00 (2006.01); H01L 21/67 (2006.01); H01L 21/683 (2006.01);
U.S. Cl.
CPC ...
H01L 21/6835 (2013.01); H01L 21/67144 (2013.01); H01L 24/63 (2013.01); H01L 24/65 (2013.01); H01L 24/73 (2013.01); H01L 24/80 (2013.01); H01L 24/95 (2013.01); H01L 2221/68309 (2013.01); H01L 2221/68313 (2013.01); H01L 2221/68354 (2013.01); H01L 2221/68368 (2013.01); H01L 2224/95144 (2013.01);
Abstract
An alignment system arranges a plurality of micro-elements at positions on a mounting substrate, the micro-elements are equal in dimension and shape. The alignment system encompasses a rough alignment-apparatus including a picker having capturing-probes, each of which having a capturing-face and a magnetic-force applying portion provided on the capturing-face, and a base-plate on which the capturing-probes are arrayed with an array-pattern. In the alignment system, each of the magnetic-force applying portions applies magnetic lines on the magnetic-force receptor to capture one of the micro-elements.