The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2025

Filed:

Jul. 26, 2022
Applicant:

Semes Co., Ltd., Cheonan-si, KR;

Inventors:

Yun Seok Bak, Seongnam-si, KR;

Hyung Joon Kim, Pyeongtaek-si, KR;

Assignee:

SEMES CO., LTD., Cheonan-si, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 37/32 (2006.01); H01J 37/34 (2006.01); H01L 21/66 (2006.01); H01L 21/67 (2006.01); H01L 21/683 (2006.01); H01L 21/687 (2006.01); H01L 21/3065 (2006.01);
U.S. Cl.
CPC ...
H01J 37/32642 (2013.01); H01J 37/32715 (2013.01); H01J 37/32807 (2013.01); H01J 37/3482 (2013.01); H01L 21/67248 (2013.01); H01L 21/68735 (2013.01); H01L 21/68742 (2013.01); H01L 21/6875 (2013.01); H01L 22/26 (2013.01); H01J 37/3244 (2013.01); H01J 2237/334 (2013.01); H01L 21/3065 (2013.01); H01L 21/6833 (2013.01);
Abstract

The inventive concept provides a substrate treating apparatus. The substrate treating apparatus includes a housing having a treating space treating a substrate; a support unit supporting the substrate at the treating space; a gas supply unit supplying a process gas into the treating space; and a plasma source generating a plasma from the process gas, and wherein the support unit comprises: a dielectric plate placing the substrate on a top surface thereof; a top ring surrounding a circumference of a substrate placed on the dielectric plate; a temperature sensor measuring a temperature of the top ring; a first lifting/lowering member lifting/lowering the top ring; and a controller, and wherein the controller controls the first lifting/lowering member to change a height of the top ring according to an etching amount of the top ring calculated based on the temperature of the top ring measured by the temperature sensor.


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