The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2025

Filed:

Apr. 06, 2022
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventor:

Thomas Koehler, Norderstedt, DE;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01); A61B 6/00 (2006.01); A61B 6/46 (2024.01); G01T 1/20 (2006.01); G16H 30/20 (2018.01);
U.S. Cl.
CPC ...
G16H 30/20 (2018.01); A61B 6/032 (2013.01); A61B 6/465 (2013.01); A61B 6/467 (2013.01); A61B 6/488 (2013.01); A61B 6/545 (2013.01); G01T 1/20182 (2020.05);
Abstract

The present invention relates to a device () and related method and computer-program product for planning an acquisition by a CT scanner (). The device receives a pre-scan image of the object from the scanner via an input (). A processor (), in use of the device, obtains a parameter selection based on the pre-scan image, in which this parameter selection comprises at least axial upper and lower scan range limits of a region of the object to be scanned. The processor determines a value indicative of an image gradient or gradient component in the pre-scan image at the upper and/or lower scan range limit or in a predetermined neighborhood thereof. If this value exceeds a threshold, a user is informed via an output () that the selected scan range does not satisfy a quality criterium for reconstruction and/or a new parameter selection is determined by repositioning, resizing and/or changing an orientation of the selected region to be scanned.


Find Patent Forward Citations

Loading…