The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2025
Filed:
Aug. 30, 2022
Applicants:
SK Hynix Inc., Icheon, KR;
Korea University Research and Business Foundation, Seoul, KR;
Inventors:
Jong Sun Park, Seoul, KR;
Kwan Ho Bae, Seoul, KR;
Jin Ho Jeong, Yongin, KR;
Seung Hwan Bang, Seoul, KR;
Assignees:
SK hynix Inc., Icheon, KR;
Korea University Research and Business Foundation, Seoul, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 29/18 (2006.01); G11C 29/00 (2006.01); G11C 29/44 (2006.01); G11C 29/46 (2006.01);
U.S. Cl.
CPC ...
G11C 29/46 (2013.01); G11C 29/18 (2013.01); G11C 29/44 (2013.01); G11C 29/4401 (2013.01); G11C 29/785 (2013.01); G11C 29/808 (2013.01);
Abstract
A dynamic fault clustering method and apparatus for efficiently managing redundancy in semiconductor memories performs a collection operation of searching for and detecting a fault and an operation of appropriately clustering the fault at the same time, which reduces an amount of time spent performing Built-In Redundancy Analysis (BIRA).