The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2025
Filed:
Feb. 07, 2024
Nxp B.v., Eindhoven, NL;
Rishi Bhooshan, Greater Noida, IN;
Hubert Martin Bode, Haar, DE;
Shilpa Gupta, Delhi, IN;
Alexander Hoefler, Austin, TX (US);
NXP B.V., Eindhoven, NL;
Abstract
An integrated circuit (IC) for detecting single event latch-ups (SELs) includes a plurality of wells of a memory circuit and a detection circuit. The detection circuit includes a selection circuit, a comparison circuit, and a fault collection and control management circuit. The selection circuit selects a well of the plurality of wells to sense a voltage or a current in the selected well. The well is selected based on a select signal that indicates a location of the well. The comparison circuit compares the sensed voltage or current with a predetermined threshold to generate a fault signal that may be indicative of the SEL in the selected well. The SEL may be indicative of a fault in the memory circuit. The fault collection and control management circuit determines corrective actions based on the detection of the location of the SEL.