The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2025
Filed:
May. 31, 2023
Wuhan University, Wuhan, CN;
WUHAN UNIVERSITY, Wuhan, CN;
Abstract
A robust on-orbit geometric calibration (GC) method based on the rational polynomial coefficient (RPC) model for spaceborne segmented linear-array camera is proposed. Through a series of processing steps, including obtaining reliable ground control point (GCP) observations based a priori gross error elimination, constructing the adjustment model for GC parameters, GC for absolute geometric distortion, GC for relative geometric distortions among segmented charge-coupled devices (CCDs), and the correction for the created bias field-of-view (FOV) distortion, this invention is able to achieve robust GC for camera distortion, as well as accurate geometric splicing and registration of segmented CCDs under the same geometric benchmark.