The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2025
Filed:
Apr. 04, 2023
Dell Products L.p., Round Rock, TX (US);
Zijia Wang, Weifang, CN;
Zhisong Liu, Shenzhen, CN;
Jiacheng Ni, Shanghai, CN;
Zhen Jia, Shanghai, CN;
Dell Products L.P., Round Rock, TX (US);
Abstract
The present disclosure relates to a method, a device, and a computer program product for model comparison. The method includes generating a detection image based on an original image. The method further includes obtaining a first classification result by sending the detection image to a target model, and obtaining a second classification result by sending the detection image to a to-be-detected model. In addition, the method further includes comparing the first classification result with the second classification result, and determining, in response to the first classification result being the same as the second classification result, that the target model is the same as the to-be-detected model. The method of the present disclosure can verify whether the to-be-detected model plagiarizes the target model without knowing any internal structure, parameters, weights, and other information of the to-be-detected model.