The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2025
Filed:
Feb. 02, 2021
Morpho, Inc., Tokyo, JP;
Tokyo Weld Co., Ltd., Tokyo, JP;
Yoshihiko Yokoyama, Tokyo, JP;
Tsukasa Kato, Tokyo, JP;
Daiju Kikuchi, Tokyo, JP;
Satoshi Hirota, Tokyo, JP;
Takuma Umeno, Tokyo, JP;
MORPHO, INC., Chiyoda-ku, JP;
TOKYO WELD CO., LTD., Ota-ku, JP;
Abstract
An analysis device for visualizing an accuracy of a trained determination device includes an acquisition unit acquiring an image pair of a non-defective product image and a defective product image, an extraction unit extracting an image region of a defective part of the defective product, a generation unit generating a plurality of image regions of pseudo-defective parts, a compositing unit synthesizing each of the image regions of the plurality of pseudo-defective parts with the non-defective product image to generate a plurality of composite images having different feature quantities, an unit outputting the plurality of composite images to the determination device and acquiring a label corresponding to each of the plurality of composite images from the determination device, and a display control unit displaying an object indicating the label corresponding to each of the plurality of composite images in an array based on the feature quantities.