The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2025

Filed:

Jul. 16, 2021
Applicant:

Microvision, Inc., Redmond, WA (US);

Inventors:

Julia Nitsch, Hamburg, DE;

Christian Fellenberg, Hamburg, DE;

Thorbjörn Posewsky, Hamburg, DE;

Jennifer Erdmann, Hamburg, DE;

Cornelia Hofsäss, Hamburg, DE;

Assignee:

Microvision, Inc., Redmond, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/00 (2022.01); G01S 17/89 (2020.01); G06V 10/764 (2022.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06V 10/764 (2022.01); G01S 17/89 (2013.01); G06V 10/82 (2022.01);
Abstract

A method for classifying targets is proposed, which comprises the extraction of features from measurement data of one or several receiving elements of a sensor by means of a neuronal network or by means of a Gaussian Mixture Model, wherein the respective measurement data of the at least one receiving element of the sensor involve at least one section of a photon histogram, and wherein the neuronal network involves a fully connected neuronal network or a convolutional neuronal network.


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