The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2025
Filed:
Oct. 23, 2023
Vivotek Inc., New Taipei, TW;
Shu-Shu Chiu, New Taipei, TW;
VIVOTEK INC., New Taipei, TW;
Abstract
An image analysis model adjustment method is applied to an image analysis apparatus. The image analysis model adjustment method includes dividing a detection image acquired by the imager analysis apparatus into a plurality of first sub-images via a valid size, transforming the plurality of first sub-images from a spatial domain to a frequency domain to generate a plurality of first frequency domain images, distributing the plurality of first frequency domain images into several crop groups via a predefined set value, analyzing frequency responses at the same frequency in each crop group to provide a specific frequency response, collecting specific frequency responses of the crop groups to generate frequency domain group data, and analyzing the frequency domain group data to acquire a prediction result of the detection image so as to decide whether to adjust the valid size in accordance with the predicted result.