The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2025
Filed:
Jan. 23, 2023
Karl Storz SE & Co. KG, Tuttlingen, DE;
KARL STORZ SE & Co. KG, Tuttlingen, DE;
Abstract
A measuring system for checking a measured-image state and/or a calibration quality for a stereo measured image, comprising: a first image capturing apparatus; a second image capturing apparatus spaced apart from the first image capturing apparatus; an output apparatus; and an evaluation apparatus designed to generate a stereo measured image from the at least first measured image and the at least second measured image by way of stereo reconstruction; wherein the evaluation apparatus is designed to check a measured-image state and/or to check the calibration quality of the stereo measured image and, should the at least one capturing defect overshoot or undershoot a predetermined threshold value, to transmit a first alert to the output device, and/or, should the calibration quality overshoot or undershoot a predetermined quality limit value, to transmit a second alert to the output device.