The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2025

Filed:

May. 06, 2023
Applicant:

Snap Inc., Santa Monica, CA (US);

Inventors:

Gurunandan Krishnan Gorumkonda, Kirkland, WA (US);

Shree K. Nayar, New York, NY (US);

Yicheng Wu, Boston, MA (US);

Assignee:

Snap Inc., Santa Monica, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/70 (2017.01); G06V 40/16 (2022.01);
U.S. Cl.
CPC ...
G06T 7/70 (2017.01); G06V 40/161 (2022.01); G06T 2207/30201 (2013.01);
Abstract

A device that measures a size of a user's face, referred to as face scaling, using a monocular camera. Depth is calculated from sparse feature points. A face mesh is used to improve the estimation accuracy. A processing pipeline detects face features by applying a face landmark detection algorithm to find the important face feature points such as the eyes, nose, and mouth. The processing pipeline estimates feature points depth using depth obtained through image defocus. The processing pipeline further scales the face using an estimated depth of the face features.


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