The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2025

Filed:

Apr. 27, 2023
Applicant:

Fulian Precision Electronics (Tianjin) Co., Ltd., Tianjin, CN;

Inventors:

Wan-Hsin Tarng, New Taipei, TW;

Cheng-Ju Yang, Taipei, TW;

Tsai-Ping Chu, New Taipei, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); B23K 37/00 (2006.01); G06T 7/136 (2017.01); G06T 7/194 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); B23K 37/00 (2013.01); G06T 7/136 (2017.01); G06T 7/194 (2017.01); G06T 2207/30141 (2013.01); G06T 2207/30152 (2013.01);
Abstract

A defect detection method includes: obtaining an image of a first defective block output by the SPI machine; wherein the first defective block is a solder paste block that is not qualified for printing after being detected by the SPI machine; processing the image of the first defective block; detecting whether solder paste printing in the first defective block is qualified; and determining that the first defective block is a second defective block and determining a defect type of the first defective block when the solder paste printing of the first defective block is not qualified. A terminal device and a non-volatile storage medium therein, for performing the above-described method, are also disclosed.


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