The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2025
Filed:
Oct. 27, 2022
GE Precision Healthcare Llc, Wauwatosa, WI (US);
The Board of Trustees of the Leland Stanford Junior University, Stanford, CA (US);
Sen Wang, Stanford, CA (US);
Yirong Yang, Stanford, CA (US);
Zhye Yin, Niskayuna, NY (US);
Adam S. Wang, Palo Alto, CA (US);
GE Precision Healthcare LLC, Waukesha, WI (US);
The Board of Trustees of the Leland Stanford Junior University, Stanford, CA (US);
Abstract
Systems/techniques that facilitate generation of image denoising training data via photon-count splitting are provided. In various embodiments, a system can access a set of sinograms generated by a photon-counting computed tomography scanner. In various aspects, the system can split the set of sinograms into a first reduced-photon-count set of sinograms and a second reduced-photon-count set of sinograms. In various instances, the system can convert, via image reconstruction, the first reduced-photon-count set of sinograms into at least one training input image and the second reduced-photon-count set of sinograms into at least one training output image. In various cases, the system can train a deep learning neural network based on the at least one training input image and the at least one training output image.