The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2025

Filed:

Dec. 16, 2019
Applicant:

Google Llc, Mountain View, CA (US);

Inventors:

Krzysztof Choromanski, Lincroft, NJ (US);

Vikas Sindhwani, Mt. Kisco, NY (US);

Aldo Pacchiano Camacho, Berkeley, CA (US);

Assignee:

GOOGLE LLC, MOUNTAIN VIEW, US;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 17/11 (2006.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 17/11 (2013.01);
Abstract

The present disclosure provides iterative blackbox optimization techniques that estimate the gradient of a function. According to an aspect of the present disclosure, a plurality of perturbations used at each iteration can be sampled from a non-orthogonal sampling distribution. As one example, in some implementations, perturbations that have been previously evaluated in previous iterations can be re-used at the current iteration, thereby conserving computing resources because the re-used perturbations do not need to be re-evaluated at the current iteration. In another example, in addition or alternatively to the use of previously evaluated perturbations, the perturbations evaluated at the current iteration can be sampled from a non-orthogonal sampling distribution.


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