The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2025

Filed:

Jul. 06, 2021
Applicant:

Sap SE, Walldorf, DE;

Inventors:

Prabal Mahanta, Bangalore, IN;

Abdul-Gafoor Mohamed, Bangalore, IN;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 16/21 (2019.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 16/211 (2019.01);
Abstract

Technologies are provided for determining a suitability of data payloads for training a machine learning model. A schema can be generated based on sample data payloads that have different data formats. The sample data payloads (and/or additional data payloads) can be converted to a format that conforms to the schema. Feature vectors can then be generated based on the converted data payloads, and used to determine a suitability of the data payloads for training a machine learning model. If the data payloads are sufficiently suitable, the converted data payloads can be used to train the machine learning mode. Otherwise, the schema may be annotated and new converted payloads may be generated based on the annotated schema. The feature vector generation and suitability analysis can then be repeated.


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