The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2025

Filed:

Mar. 07, 2024
Applicant:

Nec Laboratories America, Inc., Princeton, NJ (US);

Inventors:

Francesco Pittaluga, Los Angeles, CA (US);

Bingbing Zhuang, Santa Clara, CA (US);

Xiang Yu, Mountain View, CA (US);

Assignee:

NEC Corporation, Tokyo, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/62 (2013.01); G06V 10/75 (2022.01);
U.S. Cl.
CPC ...
G06F 21/6227 (2013.01); G06V 10/751 (2022.01);
Abstract

Systems and methods are provided for privacy-preserving image feature matching in computer vision applications, including receiving a raw image descriptor, and perturbing the raw image descriptor using a subset selection mechanism to generate a perturbed descriptor set that includes the raw image descriptor and additional descriptors. Each descriptor in the perturbed descriptor set is replaced with its nearest neighbor in a predefined descriptor database to reduce the output domain size of the subset selection mechanism. Local differential privacy (LDP) protocols are employed to further perturb the descriptor set, ensuring formal privacy guarantees, and the perturbed descriptor set is matched against a second set of descriptors for image feature matching.


Find Patent Forward Citations

Loading…