The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2025

Filed:

Dec. 08, 2023
Applicants:

Michael F. Angelo, Houston, TX (US);

Alexander Michael Hoole, Vancouver BC, CA;

Douglas Max Grover, Rigby, ID (US);

Inventors:

Michael F. Angelo, Houston, TX (US);

Alexander Michael Hoole, Vancouver BC, CA;

Douglas Max Grover, Rigby, ID (US);

Assignee:

Micro Focus LLC, Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/57 (2013.01); G06F 16/951 (2019.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01); G06F 16/951 (2019.01);
Abstract

A defect in the code of a software program is identified. An initial ranking for the defect in the code of the software program is determined. One or more network websites are crawled to identify information associated with the defect in the code of the software program. The information associated with the defect in the defect in the code of the software program is analyzed. In response to analyzing the information associated with the defect in the code of the software program, a second ranking is created for the defect in the code of the software program. The defects in the code of the software program and the second ranking are generated for display in a graphical user interface. By prioritizing which defects are more critical, the quality of the released software improved. In addition, the released software is more secure because critical defects have been removed.


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