The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2025

Filed:

Nov. 18, 2021
Applicant:

Optum, Inc., Minnetonka, MN (US);

Inventors:

Swapna Sourav Rout, Bangalore, IN;

Sudeep Choudhary, Jharkhand, IN;

Ankit Varshney, Delhi, IN;

Snigdha Sree Borra, Hyderabad, IN;

Assignee:

Optum, Inc., Minnetonka, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/215 (2019.01); G06F 16/25 (2019.01); G06N 3/045 (2023.01);
U.S. Cl.
CPC ...
G06F 16/215 (2019.01); G06F 16/258 (2019.01); G06N 3/045 (2023.01);
Abstract

Various embodiments of the present invention provide methods, apparatus, systems, computing devices, computing entities, and/or the like for performing predictive data analysis operations. For example, certain embodiments of the present invention utilize systems, methods, and computer program products that perform predictive data transformation operations by machine learning models, where the predictive data transformation is performed based at least in part on a cross comparison of a pair of columns, accounting for the similarity of both the column names and the column values, inferred by the outputs of a machine learning model. Additionally, certain embodiments of the present invention utilize systems, methods, and computer program products that perform anomaly detection by using machine learning models that operate based at least in part on a comparison of the fixed-size representation of the column values resulting from the machine learning model.


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