The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2025

Filed:

Jul. 26, 2024
Applicant:

Nvidia Corporation, Santa Clara, CA (US);

Inventors:

Nithin Anil Valentine, Santa Clara, CA (US);

Shantanu Sarangi, Santa Clara, CA (US);

Mahmut Yilmaz, Santa Clara, CA (US);

Ish Chadha, Santa Clara, CA (US);

Assignee:

NVIDIA Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 13/42 (2006.01); G01R 31/3181 (2006.01);
U.S. Cl.
CPC ...
G06F 13/4221 (2013.01); G01R 31/31813 (2013.01); G06F 2213/0026 (2013.01);
Abstract

An integrated circuit package includes two or more discrete semiconductor dies coupled to a package substrate. The dies include a primary die and at least one secondary die. The primary die includes an external data transfer interface, a direct memory access ('DMA') controller, a primary cross-die bridge, and at least one primary die-to-die interface. At least one of the secondary dies includes a secondary test controller, a secondary cross-die bridge, and a secondary die-to-die interface. A secondary die is operable to send a test data read request to a host system and to receive a test data read response therefrom. The secondary die is further operable to cause a test to be performed on circuitry within the die responsive to contents in the test data read response.


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