The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2025

Filed:

May. 01, 2024
Applicant:

Sap SE, Walldorf, DE;

Inventors:

Jingun Hong, Seoul, KR;

Dong Won Hwang, Seoul, KR;

Sumi Yun, Seoul, KR;

Won Joon Lee, Seoul, KR;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/24 (2019.01); G06F 11/14 (2006.01); G06F 11/34 (2006.01); G06F 16/21 (2019.01); G06F 16/2453 (2019.01); G06F 16/25 (2019.01);
U.S. Cl.
CPC ...
G06F 11/3414 (2013.01); G06F 11/1469 (2013.01); G06F 16/219 (2019.01); G06F 16/24542 (2019.01); G06F 16/256 (2019.01);
Abstract

Database instances can be clustered using various attributes, such as attributes reflecting resources assigned to a database instance, attributes reflecting configuration or software version information, or attributes that reflect users or usage of a database instance. As it can be resource intensive to capture database workloads, one or more database instances can be selected from one or more of the clusters and workloads can be captured from such instances. In a similar manner, various attributes can be used to cluster database instances, and one or more instances can be selected from one or more of the clusters, and a captured workload can be replayed on such instances.


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