The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2025
Filed:
Apr. 18, 2024
Rockwell Collins, Inc., Cedar Rapids, IA (US);
Eric N. Anderson, Marion, IA (US);
Matthew P. Corbett, Mount Vernon, IA (US);
Russ D. Uthe, Ely, IA (US);
Jason R. Owen, Marion, IA (US);
Rockwell Collins, Inc., Cedar Rapids, IA (US);
Abstract
A system and method for integrity monitoring on a heterogeneous system-on-a-chip (SoC) processing environment provides sets of dynamic input data to integrity applications running on one or more application cores (e.g., where safety critical applications are hosted) which generate an integrity output according to function/instruction sets. The dynamic input data is also provided to an integrity monitor running on a dissimilar integrity core (e.g., different architecture and/or other core type than the application cores) which receives the integrity output from the application cores and generates its own integrity result based on the same function sets and the same dynamic input data. The integrity monitor compares the local integrity result to the integrity outputs received from the application cores. If the integrity outputs deviate from the integrity result, the integrity core initiates a fault response, which may include resetting the deviant application core, all application cores, or the full SoC environment.