The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2025
Filed:
Mar. 23, 2023
Buckman Laboratories International, Inc., Memphis, TN (US);
Narasimha M. Rao, Collierville, TN (US);
Ryan Carli, Cordova, TN (US);
Buckman Laboratories International, Inc., Memphis, TN (US);
Abstract
A system and method is provided for correction of sensors in an industrial process. A first sensor provides first data corresponding to measured variables for at least one respective process component, which are further aggregated in data storage with corresponding contextual tags comprising time series identifiers. For a given sample from the industrial process, at least the first data having a corresponding time series identifier are obtained for comparison with second data collected via a second sensor and which comprises measured variables corresponding to the at least one respective process component from the given sample. A feedback signal is selectively generated based on a determined error between the collected first data and the collected second data corresponding to the given sample, and may in an embodiment be used for automatically calibrating the first sensor. The feedback signal may further or alternatively be used to prompt interventions in the first sensor.