The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2025
Filed:
Apr. 07, 2022
The Boeing Company, Chicago, IL (US);
Guijun Wang, Bellevue, WA (US);
Joseph R. Dvorak, Everett, WA (US);
Lu Yue, Bellevue, WA (US);
Jeff Miller, Everett, WA (US);
Edward Li, Everett, WA (US);
Raluca M. Dumitrache, Everett, WA (US);
Christopher Matsuoka, Tukwila, WA (US);
Priya Sukumaran, Bangalore, IN;
Michael J. Christian, Berkeley, MO (US);
Tripti Mandal, Bangalore, IN;
The Boeing Company, Arlington, VA (US);
Abstract
A method of developing a product is provided that includes generating a digital system model (DSM) that describes the product and a manufacturing process for the product, and generating a digital twin (DTw) of an instance of a component of the manufacturing process, the DTw including a digital replica of the instance. The method includes receiving attribute data for attributes of process/process characteristics subject to sources of variation that affect product quality. The digital replica is executed with input of the attribute data, and thereby updating the DTw to replicate the instance of the component of the manufacturing process as performed. A data analysis of the manufacturing process is performed based on the DTw as updated, and the manufacturing process is modified based on the data analysis to reduce variability in one or more product characteristics. The DTws of multiple instances may be used to generate further improvement.