The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2025
Filed:
Feb. 18, 2022
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventors:
Fumiaki Mizutani, Kanagawa, JP;
Jun Iba, Kanagawa, JP;
Assignee:
CANON KABUSHIKI KAISHA, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B 13/34 (2021.01); G01V 8/12 (2006.01); G03B 15/05 (2021.01); G06V 20/52 (2022.01); H04N 23/56 (2023.01); H04N 23/67 (2023.01); H04N 23/80 (2023.01);
U.S. Cl.
CPC ...
G03B 13/34 (2013.01); G01V 8/12 (2013.01); G03B 15/05 (2013.01); G06V 20/52 (2022.01); H04N 23/56 (2023.01); H04N 23/67 (2023.01); H04N 23/80 (2023.01);
Abstract
An imaging apparatus includes: a detector configured to detect a surface position of an object by receiving a second electromagnetic wave of which wavelength is shorter than a first electromagnetic wave; a focusing device configured to collect the first electromagnetic wave reflected on the object; at least one memory and at least one processor which function as a control unit configured to control the focusing device such that a position based on the surface position is focused on; and an image sensor configured to image the object using the first electromagnetic wave collected by the focusing device.