The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2025
Filed:
Aug. 07, 2023
Shenzhen University, Shenzhen, CN;
SHENZHEN UNIVERSITY, Shenzhen, CN;
Abstract
A point-scanning structured illumination-based super-resolution microscopic imaging system includes a first laser assembly, a second laser assembly, a scanner, a detector and a computing terminal. The first laser assembly and the second laser assembly are configured to generate an excitation light and an annular STED light, respectively. The scanner is configured to control the excitation light and the annular STED light to scan and excite a sample. The detector is configured to acquire fluorescence signals to obtain fluorescence-structured images. The computing terminal is configured to reconstruct a super-resolution image based on the fluorescence-structured images. A microscopic imaging method is also provided, in which the to-be-imaged sample is scanned and excited by an excitation light and an annular STED light to obtain a stripe structured-light image beyond the diffraction limit, and the fluorescence signals are collected by a detector synchronously and pointwise in real time.