The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2025
Filed:
Sep. 29, 2023
Tata Consultancy Services Limited, Mumbai, IN;
Amit Swain, Kolkata, IN;
Anwesha Khasnobish, Kolkata, IN;
Smriti Rani, Kolkata, IN;
Chirabrata Bhaumik, Kolkata, IN;
Tapas Chakravarty, Kolkata, IN;
TATA CONSULTANCY SERVICES LIMITED, Mumbai, IN;
Abstract
The present disclosure provides a method for surface wear inspection using millimeter wave radar. The system initially receives a plurality of uncompressed raw Synthetic Aperture Radar (SAR) images. Further, a plurality of reconstructed SAR images are generated based on the plurality of uncompressed raw SAR images using a variable focusing based Range Doppler Algorithm (RDA). Further, a master image and a slave image are selected from the reconstructed SAR images and corresponding anchor points are assigned. Further a plurality of fine level and coarse level shift coordinates are computed based on the corresponding anchor points. Further, a net shift value is computed based on the plurality of fine level and coarse level shift coordinates. The master and the slave images are aligned based on the net shift value and the interferogram is generated. The interferogram is further analyzed to profile the corresponding deformation pertaining to the surface under test.