The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2025

Filed:

Dec. 08, 2021
Applicant:

Roche Diagnostics Operations, Inc., Indianapolis, IN (US);

Inventors:

Friedemann Krause, Penzberg, DE;

Ruediger Laubender, Pullach im Isartal, DE;

Assignee:

Roche Diagnostics Operations, Inc., Indianapolis, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); G05B 23/02 (2006.01); G16H 10/40 (2018.01); G16H 40/40 (2018.01);
U.S. Cl.
CPC ...
G01N 35/00623 (2013.01); G05B 23/0235 (2013.01); G16H 10/40 (2018.01); G16H 40/40 (2018.01); G01N 2035/00653 (2013.01);
Abstract

A computer-implemented method for determining failures in laboratory equipment comprising: a) receiving a desired probability of false rejection (P̌) and a desired error detection rate (Ě), such as a desired probability of error detection (P̌), relating to one or more QC levels (J) of quality control (QC) samples to be processed by the equipment; b) setting a number of runs (R) to one; c) calculating an error detection rate (Ê) based at least partially on R; d) determining if Êis below Ě, and if so: increase R by one, and repeat steps c) to d), and if not: define a rule for determining failures in the laboratory equipment based, at least partially, on R; e) receiving or collecting standardized QC results; f) applying the rule defined in step d) to the standardized QC results; g) determining failures in the equipment, if the standardized QC results comply with the rule.


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