The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2025

Filed:

Aug. 25, 2022
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventors:

Akihiko Enamito, Kawasaki, JP;

Tatsuhiko Goto, Kawasaki, JP;

Osamu Nishimura, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/12 (2006.01); G01N 29/04 (2006.01); G01N 29/44 (2006.01);
U.S. Cl.
CPC ...
G01N 29/12 (2013.01); G01N 29/045 (2013.01); G01N 29/4463 (2013.01); G01N 2291/023 (2013.01); G01N 2291/0289 (2013.01);
Abstract

According to one embodiment, an inspection apparatus includes a vibration sensor, a microphone, and a processor. The vibration sensor detects a vibration of an inspection target object to which the vibration is excited. The microphone arranged near the inspection target object and collects a radiated sound from the inspection target object. The processor calculates an impulse response between the vibration sensor and the microphone. The processor denoises an unnecessary component from the impulse response. The processor converts the impulse response into a frequency characteristic. The processor calculates acoustic energy between the vibration sensor and the microphone based on the frequency characteristic. The processor determine the presence/absence of an abnormal state of the inspection target object.


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