The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2025

Filed:

Aug. 03, 2022
Applicant:

Seoul National University R&db Foundation, Seoul, KR;

Inventors:

Sung Jae Kim, Seoul, KR;

Sungjae Ha, Gyeonggi-do, KR;

Hyung Joo Park, Seoul, KR;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/414 (2006.01); G01N 27/333 (2006.01);
U.S. Cl.
CPC ...
G01N 27/4145 (2013.01); G01N 27/4146 (2013.01); G01N 27/333 (2013.01);
Abstract

Provided is an electrical property measuring device capable of increasing reliability of evaluation of electrical properties of 3D structures such as living tissues and biomimetic structures and simplifying a measurement process by improving an ion concentration gradient caused by an ion concentration polarization phenomenon. The electrical property measuring device includes an ion-selective permeable membrane having a porous structure; and a non-uniform microchannel spaced apart from the ion-selective permeable membrane and including a plurality of parallelly arranged flow channels through which a fluid passes, wherein cross-sectional areas of the flow channels are different.


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Kim, Sung. (2025). Electrical property measuring device including non-uniform microchannels (U.S. Patent No. 12461060). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12461060

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