The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2025

Filed:

Jul. 31, 2023
Applicant:

Stichting Imec Nederland, Wageningen, NL;

Inventors:

Rahul Yadav, Wageningen, NL;

Peter Offermans, Zaltbommel, NL;

Jan Willem De Wit, Deventer, NL;

Bas Boom, Maarssen, NL;

Assignee:

Stichting Imec Nederland, Wageningen, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 22/00 (2006.01); G01N 33/02 (2006.01); H01P 7/10 (2006.01);
U.S. Cl.
CPC ...
G01N 22/00 (2013.01); G01N 33/025 (2013.01); H01P 7/10 (2013.01);
Abstract

A device for dielectric material characterization of a test sample is provided. The device comprises a resonator block comprising a groove at at least one side of the resonator block, wherein the groove comprises at least a first inclined surface and a second inclined surface and is configured to contact the test sample via the first inclined surface and/or the second inclined surface. In this regard, the resonator block is configured to generate a rotational electric field coupled between the first inclined surface and the second inclined surface of the groove and further to propagate the rotational electric field partially or fully through the test sample in order to perform dielectric material characterization of the test sample.


Find Patent Forward Citations

Loading…