The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2025
Filed:
Feb. 05, 2021
Ntt, Inc., Tokyo, JP;
NTT, Inc., Tokyo, JP;
Abstract
A dielectric spectroscopy measuring device includes a signal generation unit that generates electromagnetic waves, a signal separation unit that separate the electromagnetic waves according to a transmission direction and outputs the separated electromagnetic waves to an output destination corresponding to the transmission direction, a changeover switch unit that receives the electromagnetic waves generated by the signal generation unit via the signal separation unit, switches an output destination, and outputs the received electromagnetic waves, and outputs electromagnetic waves returning from the output destination to the signal separation unit, a sensor unit that irradiates a measurement target with the electromagnetic waves output by the changeover switch unit, and outputs measurement target waves obtained by irradiation to the changeover switch unit, a calibration standard unit including a circuit for calibration standard, the circuit outputting reflected waves for calibration generated by receiving the electromagnetic waves output by the changeover switch unit to the changeover switch unit, a signal reception unit that receives the measurement target waves and the reflected waves for calibration via the signal separation unit, and an operation unit that receives a measurement value output by the signal reception unit receiving the measurement target waves and the reflected waves for calibration, and corrects the received measurement value of the measurement target on the basis of the measurement value corresponding to the received reflected waves for calibration.