The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2025

Filed:

Apr. 22, 2020
Applicants:

Meso Scale Technologies, Llc., Rockville, MD (US);

Gary I. Krivoy, Rockville, MD (US);

Cecilia Zimmerman, Clarksburg, MD (US);

Jules Vandersarl, Gaithersburg, MD (US);

Sandor Kovacs, Middletown, DE (US);

Aaron Leimkuehler, Upper St. Claire, PA (US);

Leo Tabakin, Germantown, MD (US);

Jon Willoughby, Potomac, MD (US);

Manish Kochar, Rockville, MD (US);

Charles M. Clinton, Clarksburg, MD (US);

Inventors:

Gary I. Krivoy, Rockville, MD (US);

Cecilia Zimmerman, Clarksburg, MD (US);

Jules Vandersarl, Gaithersburg, MD (US);

Sandor Kovacs, Middletown, DE (US);

Aaron Leimkuehler, Upper St. Claire, PA (US);

Leo Tabakin, Germantown, MD (US);

Jon Willoughby, Potomac, MD (US);

Manish Kochar, Rockville, MD (US);

Charles M. Clinton, Clarksburg, MD (US);

Assignee:

MESO SCALE TECHNOLOGIES, LLC., Rockville, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/76 (2006.01); G01N 35/00 (2006.01); G01N 35/02 (2006.01); G01N 35/04 (2006.01);
U.S. Cl.
CPC ...
G01N 21/76 (2013.01); G01N 35/00732 (2013.01); G01N 35/028 (2013.01); G01N 2035/0425 (2013.01); G01N 2035/0486 (2013.01);
Abstract

Apparatuses, systems, method, reagents, and kits for conducting assays as well as process for their preparation are described. They are particularly well suited for conducting automated analysis in a multi-well plate assay format. Also disclosed are systems, devices, and methods provided herein for using a CCD camera based system to generate measurements having reduced crosstalk between measurements of multiple spatially separated subjects. CCD camera based systems as provided herein use improved reference level clamping circuits configured to fully reset reference levels during CCD readout, thereby reducing a level of crosstalk between measurements.


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