The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2025
Filed:
Mar. 29, 2022
Ats Corporation, Cambridge, CA;
Steven Alan Christmann, Macomb, MI (US);
Stanley Kleinikkink, Kitchener, CA;
ATS CORPORATION, Cambridge, CA;
Abstract
Systems and methods for calibrating a leak test machine for a manufacturing line are provided. The leak test machine is configured to detect leakage defects in workpieces produced by the manufacturing line. The method involves operating at least one processor to: receive, from the leak test machine, defect data; receive, from at least one sensor, environmental data; update at least one predictive model using the defect data and the environmental data; receive, from the at least one sensor, current environmental data; determine at least one calibration setting for the leak test machine based on the at least one predictive model and the current environmental data, the at least one calibration setting compensating for an effect of the at least one current environment condition on the leak test machine; and test, with the leak test machine using the at least one calibration setting, at least one workpiece.