The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2025
Filed:
Sep. 15, 2021
Microadventure Technologies Llc, Henrietta, NY (US);
Blackbox Biometrics, Rochester, NY (US);
Marek Kowarz, Henrietta, NY (US);
Angela D'Orazio, Penfield, NY (US);
MicroAdventure Technologies, Henrietta, NY (US);
BlackBox Biometrics, Rochester, NY (US);
Abstract
An apparatus for characterization of one or more light sources, has an image sensor array that defines an image plane having an imaging area. An aperture spaced apart from the image plane defines the field of view that includes, for each of the one or more light sources, a corresponding incident light path that lies along a central ray beginning at the corresponding light source, extending through a center of the aperture, and terminating at the image plane. A diffraction grating forms, on the image sensor array, for each corresponding light source, a light pattern having at least a zeroth diffraction order and a first diffraction order, wherein the zeroth diffraction order is a geometrical projection of the aperture along the central ray. A control logic processor identifies a wavelength range and angular direction within the field of view for at least one of the light sources.