The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2025
Filed:
Jan. 29, 2021
Universität Konstanz, Constance, DE;
Gabriel Micard, Constance, DE;
Yves Patrick Botchak Mouafi, Reichenau, DE;
Barbara Terheiden, Constance, DE;
UNIVERSITÄT KONSTANZ, Constance, DE;
Abstract
A method and an apparatus () for computer-implemented determination of physical properties of a porous layer () present on a surface of a substrate. The physical properties include at least a layer thickness (d) of the layer, a porosity (p) of the layer and a roughness (r) of the layer at an interface () with the substrate supporting the layer. The method includes recording a reflectance curve () concerning light () irradiated onto the porous layer within a wavelength range in which the porous layer is largely transparent, setting a predetermined roughness start value, setting a porosity start value based on knowledge concerning a manufacturing process for forming the porous layer, setting a layer thickness start value based on an evaluation of periodic fluctuations of reflectance intensities within the recorded reflectance curve, and determining the physical properties of the porous layer by computer-implemented fitting of the recorded reflectance curve using a non-linear least squares method.