The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2025
Filed:
Mar. 14, 2023
Aris Technology Llc, Batavia, IL (US);
Mingu Kang, Chicago, IL (US);
Levi Armstrong, Kerrville, TX (US);
Matthew M. Robinson, San Antonio, TX (US);
Marc Alban, San Antonio, TX (US);
Brad Johnson, Plainfield, IL (US);
James Clark, Baden, PA (US);
ARIS TECHNOLOGY LLC, Batavia, IL (US);
Abstract
A metrology three-dimensional (3D) scanning system includes a metrology 3D scanning application (app) comprising computing instructions that, when executed by one or more processors, causing the one or more processors to: record human-robot interaction (HRI) data as a human operator operates the HRI device; generate a preliminary scan path based on the HRI data for operating a robotic element within an operating environment; move the robotic element along at least a portion of the preliminary scan path and record preliminary scan data comprising at least a subset of dimension data defining at least a target object; generate a metrology scanning path plan and a motion plan for the robotic element based on the preliminary scan data; and execute instructions to move the robotic element within the operating environment according to the metrology scanning path plan and the motion plan for scanning the target object.