The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2025
Filed:
Jul. 13, 2023
Hitachi, Ltd., Tokyo, JP;
Supriya Sathyanarayana, Milpitas, CA (US);
Joydeep Acharya, Milpitas, CA (US);
Hitachi, Ltd., Tokyo, JP;
Abstract
A method for object defect detection. The method may include receiving an object on a production line; computing, by a processor, a motion optimized path for a robot arm, wherein the motion optimized path comprises a path for performing a sequence of rotations by the robot arm on the object for image capturing; using the robot arm to grasp the object and moving the robot arm according to the motion optimized path to rotate the object based on the sequence of rotations; capturing, by a camera, a plurality of images of the object while the object is being rotated; performing, by the processor, defect detection on the plurality of images of the object to determine object defect; and for object defect being detected, issuing, by the processor, a defect notification to an operator of the production line.