The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2025

Filed:

Jun. 01, 2022
Applicant:

Wavefront Dynamics, Inc., Albuquerque, NM (US);

Inventors:

Daniel R. Neal, Albuquerque, NM (US);

R. James Copland, Albuquerque, NM (US);

Jeff Kolberg, Laguna Beach, CA (US);

Assignee:

WaveFront Dynamics, Inc., Albuquerque, NM (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61F 9/008 (2006.01);
U.S. Cl.
CPC ...
A61F 9/008 (2013.01); A61F 9/00804 (2013.01); A61F 2009/0087 (2013.01); A61F 2009/0088 (2013.01); A61F 2009/00897 (2013.01); A61F 2240/002 (2013.01);
Abstract

Method steps for correcting vision in an eye that uses a customized phakic IOL composing: (1) measuring one or more wavefront aberrations of the eye: (2) designing a wavefront-customized correction profile for an Intraocular Lens (IOL); (3) creating a customized IOL with the customized correction profile; and (4) implanting the customized IOL in the eye. Alternatively, an uncorrected IOL is first implanted and aligned in the eye, followed by in-situ scanning a femtosecond laser spot across the implanted IOL to locally change the Index of Refraction of the IOL material and create an in-situ customized IOL.


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