The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2025
Filed:
May. 08, 2023
Fujifilm Healthcare Corporation, Kashiwa, JP;
Kana Kobayashi, Chiba, JP;
Taiga Goto, Chiba, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
Provided is an X-ray CT apparatus including a learned model generated by acquiring one or more learning data sets from one imaging without increasing exposure of a subject, and performing machine learning using the acquired learning set. The learned model is a model after learning in which a low-quality image is input data and a high-quality image is training data. The low-quality image and the high-quality image are obtained based on the same learning measurement data or learning projection data obtained by logarithmically converting the learning measurement data. The low-quality image is a CT image reconstructed from partial data obtained by dividing the learning measurement data or the learning projection data, and the high-quality image is a CT image obtained by reconstructing the learning projection data.